BS EN 165000-4-1996 薄膜集成电路和混合集成电路.用户信息,产品评估第级一览表和空白详细规范

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【英文标准名称】:Filmandhybridintegratedcircuits.Customerinformation,productassessmentlevelschedulesandblankdetailspecification
【原文标准名称】:薄膜集成电路和混合集成电路.用户信息,产品评估第级一览表和空白详细规范
【标准号】:BSEN165000-4-1996
【标准状态】:现行
【国别】:英国
【发布日期】:1996-10-15
【实施或试行日期】:1996-10-15
【发布单位】:英国标准学会(GB-BSI)
【起草单位】:BSI
【标准类型】:()
【标准水平】:()
【中文主题词】:混合集成电路;膜集成电路;能力鉴定;集成电路;技术数据单;质量评估;贸易文件;抽样方法;电气试验;电子设备及元件;销售文件;验收(鉴定);技术文献;质量保证体系;评估的质量;质量保证;口述;认证(认可)
【英文主题词】:Acceptance(approval);Assessmentlevel;Capabilityapproval;Certification(approval);Commercialdocuments;Declarations;Detailspecification;Electricalengineering;Electricaltesting;Electronicequipmentandcomponents;Filmcircuits;Hybridfilmintegratedcircuits;Hybridintegratedcircuits;Integratedcircuits;Integratedfilmcircuits;Orderindications;Qualityassessment;Qualityassurance;Qualityassurancesystems;Qualitycontrol;Salesdocuments;Samplingmethods;Specification;Technicaldatasheets;Technicaldocuments
【摘要】:FilmandhybridintegratedcircuitsPart4.Customerinformation,productassessmentlevelschedulesandblankdetailspecification1Introduction1.1HowEN165000works1.2Customer/manufacturerinterface1.3Theproductassessmentlevelschedules1.3.1Derivationoftheproductassessmentlevelschedules1.3.2Indicationofapplicationsfortheproductassessmentlevelschedules1.4TestrequirementsofthePALSandtheirapplicabilitytoreallifeapplication1.4.1Theoriginoftheinspectionrequirements1.4.2Electricaltests1.4.3Otherscreeningtests1.4.4Devicesampletesting1.4.5Designevaluationtesting1.4.6AQLs,inspectionlevelsandsamplingplans2ProductassessmentlevelschedulesanddetailspecificationsPALS1-113BlankdetailspecificationrequirementsFrontpageforstandardcataloguecircuitsFrontpageforcustomercircuitsSectionone—generaldataSectiontwo—inspectionrequirementsExampleofacustomerdetailspecificationTables1PALSforsolderorchip&wire(non-hermetic)assembly2PALSforchip&wire(hermetic)assembly
【中国标准分类号】:L57;L58
【国际标准分类号】:31_200
【页数】:60P.;A4
【正文语种】:英语